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F. Brizuela, H. Bravo, G. Vaschenko, C. S. Menoni, J. J. Rocca, O. Hemberg, B. Frazer, S. Bloom, W. Chao, E. H. Anderson, and D. T. Attwood, “Ablation of nanometer-scale features using a table-top soft x-ray laser,” in Frontiers in Optics, OSA Technical Digest (CD) (Optical Society of America, 2006), paper JSuA21.
[Crossref]
L. Kipp, M. Skibowski, R. L. Johnson, R. Berndt, R. Adelung, S. Harm, and R. Seemann, “Sharper images by focusing soft X-ray with photon sieves,” Nature 414, 184–188 (2001).
[Crossref]
[PubMed]
F. Brizuela, H. Bravo, G. Vaschenko, C. S. Menoni, J. J. Rocca, O. Hemberg, B. Frazer, S. Bloom, W. Chao, E. H. Anderson, and D. T. Attwood, “Ablation of nanometer-scale features using a table-top soft x-ray laser,” in Frontiers in Optics, OSA Technical Digest (CD) (Optical Society of America, 2006), paper JSuA21.
[Crossref]
F. Brizuela, H. Bravo, G. Vaschenko, C. S. Menoni, J. J. Rocca, O. Hemberg, B. Frazer, S. Bloom, W. Chao, E. H. Anderson, and D. T. Attwood, “Ablation of nanometer-scale features using a table-top soft x-ray laser,” in Frontiers in Optics, OSA Technical Digest (CD) (Optical Society of America, 2006), paper JSuA21.
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F. Brizuela, H. Bravo, G. Vaschenko, C. S. Menoni, J. J. Rocca, O. Hemberg, B. Frazer, S. Bloom, W. Chao, E. H. Anderson, and D. T. Attwood, “Ablation of nanometer-scale features using a table-top soft x-ray laser,” in Frontiers in Optics, OSA Technical Digest (CD) (Optical Society of America, 2006), paper JSuA21.
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F. Brizuela, H. Bravo, G. Vaschenko, C. S. Menoni, J. J. Rocca, O. Hemberg, B. Frazer, S. Bloom, W. Chao, E. H. Anderson, and D. T. Attwood, “Ablation of nanometer-scale features using a table-top soft x-ray laser,” in Frontiers in Optics, OSA Technical Digest (CD) (Optical Society of America, 2006), paper JSuA21.
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J. M. Davila, “High-resolution solar imaging with a photon sieve,” Proc. SPIE 8148, 81480O (2011).
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F. Brizuela, H. Bravo, G. Vaschenko, C. S. Menoni, J. J. Rocca, O. Hemberg, B. Frazer, S. Bloom, W. Chao, E. H. Anderson, and D. T. Attwood, “Ablation of nanometer-scale features using a table-top soft x-ray laser,” in Frontiers in Optics, OSA Technical Digest (CD) (Optical Society of America, 2006), paper JSuA21.
[Crossref]
M. C. Gupta and D. Carlson, “Laser processing of materials for renewable energy applications,” MRS Energy Sustainability 2, E2 (2015).
[Crossref]
P. O. Caffrey, B. K. Nayak, and M. C. Gupta, “Ultrafast laser-induced microstructure/nanostructure replication and optical properties,” Appl. Opt. 51, 604–609 (2012).
[Crossref]
[PubMed]
B. K. Nayak and M. C. Gupta, “Self-organized micro/nano structures in metal surfaces by ultrafast laser irradiation,” Opt. Lasers Eng. 48, 940–949 (2010).
[Crossref]
M. El-Bandrawy and M. C. Gupta, “Femtosecond laser micromachining of submicron features,” in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference, OSA Technical Digest (Optical Society of America, 2003), paper CFF7.
L. Kipp, M. Skibowski, R. L. Johnson, R. Berndt, R. Adelung, S. Harm, and R. Seemann, “Sharper images by focusing soft X-ray with photon sieves,” Nature 414, 184–188 (2001).
[Crossref]
[PubMed]
Y. Tang, S. Hu, Y. Yang, and Y. He, “Focusing property of high numerical aperture photon sieves based on vector diffraction,” Opt. Commun. 295, 1–4 (2013).
[Crossref]
F. Brizuela, H. Bravo, G. Vaschenko, C. S. Menoni, J. J. Rocca, O. Hemberg, B. Frazer, S. Bloom, W. Chao, E. H. Anderson, and D. T. Attwood, “Ablation of nanometer-scale features using a table-top soft x-ray laser,” in Frontiers in Optics, OSA Technical Digest (CD) (Optical Society of America, 2006), paper JSuA21.
[Crossref]
Y. Tang, S. Hu, Y. Yang, and Y. He, “Focusing property of high numerical aperture photon sieves based on vector diffraction,” Opt. Commun. 295, 1–4 (2013).
[Crossref]
M. Domke, L. Nobile, S. Rapp, S. Eiselen, J. Sotrop, H. P. Huber, and M. Schmidt, “Understanding thin film laser ablation: the role of the effective penetration depth and the film thickness,” Physics Procedia 56, 1007–1014 (2014).
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J. Jia, J. Jiang, C. Xie, and M. Liu, “Photon sieve for reduction of the far-field diffraction spot size in the laser free-space communication system,” Opt. Commun. 281(17), 4536–4539 (2008).
[Crossref]
L. Kipp, M. Skibowski, R. L. Johnson, R. Berndt, R. Adelung, S. Harm, and R. Seemann, “Sharper images by focusing soft X-ray with photon sieves,” Nature 414, 184–188 (2001).
[Crossref]
[PubMed]
F. S. Oktem, F. Kamalabadi, and J. M. Davila, “High-resolution computational spectral imaging with photon sieves,” in Proc. IEEE Int. Conf. on Image Processing (ICIP) (2014), pp. 5122–5126.
L. Kipp, M. Skibowski, R. L. Johnson, R. Berndt, R. Adelung, S. Harm, and R. Seemann, “Sharper images by focusing soft X-ray with photon sieves,” Nature 414, 184–188 (2001).
[Crossref]
[PubMed]
J. Jia, J. Jiang, C. Xie, and M. Liu, “Photon sieve for reduction of the far-field diffraction spot size in the laser free-space communication system,” Opt. Commun. 281(17), 4536–4539 (2008).
[Crossref]
W. N. Parker, A. D. Brodie, and J. H. McCoy, “High-throughput NGL electron-beam direct-write lithography system,” Proc. SPIE 3997, 713–720 (2000).
[Crossref]
F. Brizuela, H. Bravo, G. Vaschenko, C. S. Menoni, J. J. Rocca, O. Hemberg, B. Frazer, S. Bloom, W. Chao, E. H. Anderson, and D. T. Attwood, “Ablation of nanometer-scale features using a table-top soft x-ray laser,” in Frontiers in Optics, OSA Technical Digest (CD) (Optical Society of America, 2006), paper JSuA21.
[Crossref]
P. P Pronko, S. K Dutta, J Squier, J. V Rudd, D Du, and G Mourou, “Machining of sub-micron holes using a femtosecond laser at 800 nm,” Opt. Commun. 114(1), 106–110 (1995).
[Crossref]
M. Domke, L. Nobile, S. Rapp, S. Eiselen, J. Sotrop, H. P. Huber, and M. Schmidt, “Understanding thin film laser ablation: the role of the effective penetration depth and the film thickness,” Physics Procedia 56, 1007–1014 (2014).
[Crossref]
F. S. Oktem, F. Kamalabadi, and J. M. Davila, “High-resolution computational spectral imaging with photon sieves,” in Proc. IEEE Int. Conf. on Image Processing (ICIP) (2014), pp. 5122–5126.
M. Castillejo, P. M. Ossi, and L. Zhigilei, Lasers in Materials Science (Springer, 2014).
[Crossref]
W. N. Parker, A. D. Brodie, and J. H. McCoy, “High-throughput NGL electron-beam direct-write lithography system,” Proc. SPIE 3997, 713–720 (2000).
[Crossref]
P. P Pronko, S. K Dutta, J Squier, J. V Rudd, D Du, and G Mourou, “Machining of sub-micron holes using a femtosecond laser at 800 nm,” Opt. Commun. 114(1), 106–110 (1995).
[Crossref]
M. Domke, L. Nobile, S. Rapp, S. Eiselen, J. Sotrop, H. P. Huber, and M. Schmidt, “Understanding thin film laser ablation: the role of the effective penetration depth and the film thickness,” Physics Procedia 56, 1007–1014 (2014).
[Crossref]
F. Brizuela, H. Bravo, G. Vaschenko, C. S. Menoni, J. J. Rocca, O. Hemberg, B. Frazer, S. Bloom, W. Chao, E. H. Anderson, and D. T. Attwood, “Ablation of nanometer-scale features using a table-top soft x-ray laser,” in Frontiers in Optics, OSA Technical Digest (CD) (Optical Society of America, 2006), paper JSuA21.
[Crossref]
P. P Pronko, S. K Dutta, J Squier, J. V Rudd, D Du, and G Mourou, “Machining of sub-micron holes using a femtosecond laser at 800 nm,” Opt. Commun. 114(1), 106–110 (1995).
[Crossref]
M. Domke, L. Nobile, S. Rapp, S. Eiselen, J. Sotrop, H. P. Huber, and M. Schmidt, “Understanding thin film laser ablation: the role of the effective penetration depth and the film thickness,” Physics Procedia 56, 1007–1014 (2014).
[Crossref]
L. Kipp, M. Skibowski, R. L. Johnson, R. Berndt, R. Adelung, S. Harm, and R. Seemann, “Sharper images by focusing soft X-ray with photon sieves,” Nature 414, 184–188 (2001).
[Crossref]
[PubMed]
L. Kipp, M. Skibowski, R. L. Johnson, R. Berndt, R. Adelung, S. Harm, and R. Seemann, “Sharper images by focusing soft X-ray with photon sieves,” Nature 414, 184–188 (2001).
[Crossref]
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M. Domke, L. Nobile, S. Rapp, S. Eiselen, J. Sotrop, H. P. Huber, and M. Schmidt, “Understanding thin film laser ablation: the role of the effective penetration depth and the film thickness,” Physics Procedia 56, 1007–1014 (2014).
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P. P Pronko, S. K Dutta, J Squier, J. V Rudd, D Du, and G Mourou, “Machining of sub-micron holes using a femtosecond laser at 800 nm,” Opt. Commun. 114(1), 106–110 (1995).
[Crossref]
Y. Tang, S. Hu, Y. Yang, and Y. He, “Focusing property of high numerical aperture photon sieves based on vector diffraction,” Opt. Commun. 295, 1–4 (2013).
[Crossref]
F. Brizuela, H. Bravo, G. Vaschenko, C. S. Menoni, J. J. Rocca, O. Hemberg, B. Frazer, S. Bloom, W. Chao, E. H. Anderson, and D. T. Attwood, “Ablation of nanometer-scale features using a table-top soft x-ray laser,” in Frontiers in Optics, OSA Technical Digest (CD) (Optical Society of America, 2006), paper JSuA21.
[Crossref]
J. Jia, J. Jiang, C. Xie, and M. Liu, “Photon sieve for reduction of the far-field diffraction spot size in the laser free-space communication system,” Opt. Commun. 281(17), 4536–4539 (2008).
[Crossref]
Y. Tang, S. Hu, Y. Yang, and Y. He, “Focusing property of high numerical aperture photon sieves based on vector diffraction,” Opt. Commun. 295, 1–4 (2013).
[Crossref]
M. Castillejo, P. M. Ossi, and L. Zhigilei, Lasers in Materials Science (Springer, 2014).
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[PubMed]
M. C. Gupta and D. Carlson, “Laser processing of materials for renewable energy applications,” MRS Energy Sustainability 2, E2 (2015).
[Crossref]
L. Kipp, M. Skibowski, R. L. Johnson, R. Berndt, R. Adelung, S. Harm, and R. Seemann, “Sharper images by focusing soft X-ray with photon sieves,” Nature 414, 184–188 (2001).
[Crossref]
[PubMed]
J. Jia, J. Jiang, C. Xie, and M. Liu, “Photon sieve for reduction of the far-field diffraction spot size in the laser free-space communication system,” Opt. Commun. 281(17), 4536–4539 (2008).
[Crossref]
P. P Pronko, S. K Dutta, J Squier, J. V Rudd, D Du, and G Mourou, “Machining of sub-micron holes using a femtosecond laser at 800 nm,” Opt. Commun. 114(1), 106–110 (1995).
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Y. Tang, S. Hu, Y. Yang, and Y. He, “Focusing property of high numerical aperture photon sieves based on vector diffraction,” Opt. Commun. 295, 1–4 (2013).
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B. K. Nayak and M. C. Gupta, “Self-organized micro/nano structures in metal surfaces by ultrafast laser irradiation,” Opt. Lasers Eng. 48, 940–949 (2010).
[Crossref]
M. Domke, L. Nobile, S. Rapp, S. Eiselen, J. Sotrop, H. P. Huber, and M. Schmidt, “Understanding thin film laser ablation: the role of the effective penetration depth and the film thickness,” Physics Procedia 56, 1007–1014 (2014).
[Crossref]
W. N. Parker, A. D. Brodie, and J. H. McCoy, “High-throughput NGL electron-beam direct-write lithography system,” Proc. SPIE 3997, 713–720 (2000).
[Crossref]
J. M. Davila, “High-resolution solar imaging with a photon sieve,” Proc. SPIE 8148, 81480O (2011).
[Crossref]
F. S. Oktem, F. Kamalabadi, and J. M. Davila, “High-resolution computational spectral imaging with photon sieves,” in Proc. IEEE Int. Conf. on Image Processing (ICIP) (2014), pp. 5122–5126.
F. Brizuela, H. Bravo, G. Vaschenko, C. S. Menoni, J. J. Rocca, O. Hemberg, B. Frazer, S. Bloom, W. Chao, E. H. Anderson, and D. T. Attwood, “Ablation of nanometer-scale features using a table-top soft x-ray laser,” in Frontiers in Optics, OSA Technical Digest (CD) (Optical Society of America, 2006), paper JSuA21.
[Crossref]
M. El-Bandrawy and M. C. Gupta, “Femtosecond laser micromachining of submicron features,” in Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference, OSA Technical Digest (Optical Society of America, 2003), paper CFF7.
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[Crossref]