S. Zhang, “Comparative study on passive and active projector nonlinear gamma calibration,” Appl. Opt. 54(13), 3834–3841 (2015).

[Crossref]

Z. Cai, X. Liu, H. Jiang, D. He, X. Peng, S. Huang, and Z. Zhang, “Flexible phase error compensation based on Hilbert transform in phase shifting profilometry,” Opt. Express 23, 25171–25181 (2015).

[Crossref]

D. Zheng and F. Da, “Absolute phase retrieval for defocused fringe projection three-dimensional measurement,” Opt. Commun. 312, 302–311 (2014).

[Crossref]

J. Dai, B. Li, and S. Zhang, “High-quality fringe pattern generation using binary pattern optimization through symmetry and periodicity,” Opt. Lasers Eng. 52, 195–200 (2014).

[Crossref]

Z. Wang, D. A. Nguyen, and J. C. Barnes, “Some practical considerations in fringe projection profilometry,” Opt. Lasers Eng. 48(2), 218–225 (2010).

[Crossref]

J. Salvi, S. Fernandez, T. Pribanic, and X. Llado, “A state of the art in structured light patterns for surface profilometry,” Pattern Recognit. 43(8), 2666–2680 (2010).

[Crossref]

S. Gorthi and P. Rastogi, “Fringe Projection Techniques: Whither we are?” Opt. Lasers Eng. 48(2), 133–140 (2010).

[Crossref]

K. Liu, Y. Wang, D. Lau, Q. Hao, and L. Hassebrook, “Gamma model and its analysis for phase measuring profilometry,” J. Opt. Soc. Am. A 27(3), 553–562 (2010).

[Crossref]

T. Hoang, B. Pan, D. Nguyen, and Z. Wang, “Generic gamma correction for accuracy enhancement in fringe-projection profilometry,” Opt. Lett. 35(12), 1992–1994 (2010).

[Crossref]

Y. Li, C. Zhao, Y. Qian, H. Wang, and H. Jin, “High-speed and dense three-dimensional surface acquisition using defocused binary patterns for spatially isolated objects,” Opt. Express 18, 21628–21635 (2010).

[Crossref]

Y. Wang and S. Zhang, “Optimal pulse width modulation for sinusoidal fringe generation with projector defocusing,” Opt. Lett. 35(24), 4121–4123 (2010).

[Crossref]

G. H. Notni and G. Notni, “Digital fringe projection in 3D shape measurement: an error analysis,” Proc. SPIE 5144, 372–380 (2003).

[Crossref]

C. Quan, X. Y. He, C. F. Wang, C. J. Tay, and H. M. Shang, “Shape measurement of small objects using LCD fringe projection with phase shifting,” Opt. Commun. 189(1-3), 21–29 (2001).

[Crossref]

X. Y. Su, W. Zhou, G. von Bally, and D. Vukicevic, “Automated phase-measuring profilometry using defocused projection of a Ronchi grating,” Opt. Commun. 94, 561–573 (1992).

[Crossref]

M. J. Baker, J. Xi, and J. F. Chicharo, “Elimination of gamma non-linear luminance effects for digital video projection phase measuring profilometers,” in 4th IEEE International Symposium on Electronic Design, Test and Applications (IEEE, 2008), pp. 496–501.

Z. Wang, D. A. Nguyen, and J. C. Barnes, “Some practical considerations in fringe projection profilometry,” Opt. Lasers Eng. 48(2), 218–225 (2010).

[Crossref]

M. J. Baker, J. Xi, and J. F. Chicharo, “Elimination of gamma non-linear luminance effects for digital video projection phase measuring profilometers,” in 4th IEEE International Symposium on Electronic Design, Test and Applications (IEEE, 2008), pp. 496–501.

D. Zheng and F. Da, “Absolute phase retrieval for defocused fringe projection three-dimensional measurement,” Opt. Commun. 312, 302–311 (2014).

[Crossref]

J. Dai, B. Li, and S. Zhang, “High-quality fringe pattern generation using binary pattern optimization through symmetry and periodicity,” Opt. Lasers Eng. 52, 195–200 (2014).

[Crossref]

Y. Xu, L. Ekstrand, J. Dai, and S. Zhang, “Phase error compensation for three-dimensional shape measurement with projector defocusing,” Appl. Opt. 50(17), 2572–2581 (2011).

[Crossref]

J. Salvi, S. Fernandez, T. Pribanic, and X. Llado, “A state of the art in structured light patterns for surface profilometry,” Pattern Recognit. 43(8), 2666–2680 (2010).

[Crossref]

S. Gorthi and P. Rastogi, “Fringe Projection Techniques: Whither we are?” Opt. Lasers Eng. 48(2), 133–140 (2010).

[Crossref]

C. Quan, X. Y. He, C. F. Wang, C. J. Tay, and H. M. Shang, “Shape measurement of small objects using LCD fringe projection with phase shifting,” Opt. Commun. 189(1-3), 21–29 (2001).

[Crossref]

J. Dai, B. Li, and S. Zhang, “High-quality fringe pattern generation using binary pattern optimization through symmetry and periodicity,” Opt. Lasers Eng. 52, 195–200 (2014).

[Crossref]

Z. Li and Y. Li, “Gamma-distorted fringe image modeling and accurate gamma correction for fast phase measuring profilometry,” Opt. Lett. 36(2), 154–156 (2011).

[Crossref]

Y. Li, C. Zhao, Y. Qian, H. Wang, and H. Jin, “High-speed and dense three-dimensional surface acquisition using defocused binary patterns for spatially isolated objects,” Opt. Express 18, 21628–21635 (2010).

[Crossref]

J. Salvi, S. Fernandez, T. Pribanic, and X. Llado, “A state of the art in structured light patterns for surface profilometry,” Pattern Recognit. 43(8), 2666–2680 (2010).

[Crossref]

Z. Wang, D. A. Nguyen, and J. C. Barnes, “Some practical considerations in fringe projection profilometry,” Opt. Lasers Eng. 48(2), 218–225 (2010).

[Crossref]

G. H. Notni and G. Notni, “Digital fringe projection in 3D shape measurement: an error analysis,” Proc. SPIE 5144, 372–380 (2003).

[Crossref]

G. H. Notni and G. Notni, “Digital fringe projection in 3D shape measurement: an error analysis,” Proc. SPIE 5144, 372–380 (2003).

[Crossref]

T. Hoang, B. Pan, D. Nguyen, and Z. Wang, “Generic gamma correction for accuracy enhancement in fringe-projection profilometry,” Opt. Lett. 35(12), 1992–1994 (2010).

[Crossref]

B. Pan, Q. Kemao, L. Huang, and A. Asundi, “Phase error analysis and compensation for nonsinusoidal waveforms in phase-shifting digital fringe projection profilometry,” Opt. Lett. 34(4), 416–418 (2009).

J. Salvi, S. Fernandez, T. Pribanic, and X. Llado, “A state of the art in structured light patterns for surface profilometry,” Pattern Recognit. 43(8), 2666–2680 (2010).

[Crossref]

C. Quan, X. Y. He, C. F. Wang, C. J. Tay, and H. M. Shang, “Shape measurement of small objects using LCD fringe projection with phase shifting,” Opt. Commun. 189(1-3), 21–29 (2001).

[Crossref]

J. Salvi, S. Fernandez, T. Pribanic, and X. Llado, “A state of the art in structured light patterns for surface profilometry,” Pattern Recognit. 43(8), 2666–2680 (2010).

[Crossref]

C. Quan, X. Y. He, C. F. Wang, C. J. Tay, and H. M. Shang, “Shape measurement of small objects using LCD fringe projection with phase shifting,” Opt. Commun. 189(1-3), 21–29 (2001).

[Crossref]

X. Y. Su, W. Zhou, G. von Bally, and D. Vukicevic, “Automated phase-measuring profilometry using defocused projection of a Ronchi grating,” Opt. Commun. 94, 561–573 (1992).

[Crossref]

C. Quan, X. Y. He, C. F. Wang, C. J. Tay, and H. M. Shang, “Shape measurement of small objects using LCD fringe projection with phase shifting,” Opt. Commun. 189(1-3), 21–29 (2001).

[Crossref]

X. Y. Su, W. Zhou, G. von Bally, and D. Vukicevic, “Automated phase-measuring profilometry using defocused projection of a Ronchi grating,” Opt. Commun. 94, 561–573 (1992).

[Crossref]

X. Y. Su, W. Zhou, G. von Bally, and D. Vukicevic, “Automated phase-measuring profilometry using defocused projection of a Ronchi grating,” Opt. Commun. 94, 561–573 (1992).

[Crossref]

C. Quan, X. Y. He, C. F. Wang, C. J. Tay, and H. M. Shang, “Shape measurement of small objects using LCD fringe projection with phase shifting,” Opt. Commun. 189(1-3), 21–29 (2001).

[Crossref]

Y. Wang and S. Zhang, “Optimal pulse width modulation for sinusoidal fringe generation with projector defocusing,” Opt. Lett. 35(24), 4121–4123 (2010).

[Crossref]

K. Liu, Y. Wang, D. Lau, Q. Hao, and L. Hassebrook, “Gamma model and its analysis for phase measuring profilometry,” J. Opt. Soc. Am. A 27(3), 553–562 (2010).

[Crossref]

T. Hoang, B. Pan, D. Nguyen, and Z. Wang, “Generic gamma correction for accuracy enhancement in fringe-projection profilometry,” Opt. Lett. 35(12), 1992–1994 (2010).

[Crossref]

Z. Wang, D. A. Nguyen, and J. C. Barnes, “Some practical considerations in fringe projection profilometry,” Opt. Lasers Eng. 48(2), 218–225 (2010).

[Crossref]

M. J. Baker, J. Xi, and J. F. Chicharo, “Elimination of gamma non-linear luminance effects for digital video projection phase measuring profilometers,” in 4th IEEE International Symposium on Electronic Design, Test and Applications (IEEE, 2008), pp. 496–501.

S. Zhang, “Comparative study on passive and active projector nonlinear gamma calibration,” Appl. Opt. 54(13), 3834–3841 (2015).

[Crossref]

J. Dai, B. Li, and S. Zhang, “High-quality fringe pattern generation using binary pattern optimization through symmetry and periodicity,” Opt. Lasers Eng. 52, 195–200 (2014).

[Crossref]

W. Lohry and S. Zhang, “Genetic method to optimize binary dithering technique for high-quality fringe generation,” Opt. Lett. 38(4), 540 (2013).

[Crossref]

Y. Xu, L. Ekstrand, J. Dai, and S. Zhang, “Phase error compensation for three-dimensional shape measurement with projector defocusing,” Appl. Opt. 50(17), 2572–2581 (2011).

[Crossref]

Y. Wang and S. Zhang, “Optimal pulse width modulation for sinusoidal fringe generation with projector defocusing,” Opt. Lett. 35(24), 4121–4123 (2010).

[Crossref]

S. Lei and S. Zhang, “Flexible 3-D shape measurement using projector defocusing,” Opt. Lett. 34(20), 3080–3082 (2009).

[Crossref]

S. Zhang and S. T. Yau, “Generic nonsinusoidal phase error correction for three-dimensional shape measurement using a digital video projector,” Appl. Opt. 46(1), 36 (2007).

[Crossref]

D. Zheng and F. Da, “Absolute phase retrieval for defocused fringe projection three-dimensional measurement,” Opt. Commun. 312, 302–311 (2014).

[Crossref]

X. Y. Su, W. Zhou, G. von Bally, and D. Vukicevic, “Automated phase-measuring profilometry using defocused projection of a Ronchi grating,” Opt. Commun. 94, 561–573 (1992).

[Crossref]

S. Zhang, “Comparative study on passive and active projector nonlinear gamma calibration,” Appl. Opt. 54(13), 3834–3841 (2015).

[Crossref]

H Guo, H He, and M Chen, “Gamma correction for digital fringe projection profilometry,” Appl. Opt. 43(14), 2906–2914 (2004).

[Crossref]

Y. Xu, L. Ekstrand, J. Dai, and S. Zhang, “Phase error compensation for three-dimensional shape measurement with projector defocusing,” Appl. Opt. 50(17), 2572–2581 (2011).

[Crossref]

S. Zhang and S. T. Yau, “Generic nonsinusoidal phase error correction for three-dimensional shape measurement using a digital video projector,” Appl. Opt. 46(1), 36 (2007).

[Crossref]

A. Patil, R. Langoju, P. Rastogi, and S. Ramani, “Statistical study and experimental verification of high-resolution methods in phase-shifting interferometry,” J. Opt. Soc. Am. A 24(3), 794–813 (2007).

[Crossref]

K. Liu, Y. Wang, D. Lau, Q. Hao, and L. Hassebrook, “Gamma model and its analysis for phase measuring profilometry,” J. Opt. Soc. Am. A 27(3), 553–562 (2010).

[Crossref]

C. Rathjen, “Statistical properties of phase-shift algorithms,” J. Opt. Soc. Am. A 12(9), 1997–2008 (1995).

[Crossref]

C. Quan, X. Y. He, C. F. Wang, C. J. Tay, and H. M. Shang, “Shape measurement of small objects using LCD fringe projection with phase shifting,” Opt. Commun. 189(1-3), 21–29 (2001).

[Crossref]

X. Y. Su, W. Zhou, G. von Bally, and D. Vukicevic, “Automated phase-measuring profilometry using defocused projection of a Ronchi grating,” Opt. Commun. 94, 561–573 (1992).

[Crossref]

D. Zheng and F. Da, “Absolute phase retrieval for defocused fringe projection three-dimensional measurement,” Opt. Commun. 312, 302–311 (2014).

[Crossref]

Y. Li, C. Zhao, Y. Qian, H. Wang, and H. Jin, “High-speed and dense three-dimensional surface acquisition using defocused binary patterns for spatially isolated objects,” Opt. Express 18, 21628–21635 (2010).

[Crossref]

Z. Cai, X. Liu, H. Jiang, D. He, X. Peng, S. Huang, and Z. Zhang, “Flexible phase error compensation based on Hilbert transform in phase shifting profilometry,” Opt. Express 23, 25171–25181 (2015).

[Crossref]

J. Dai, B. Li, and S. Zhang, “High-quality fringe pattern generation using binary pattern optimization through symmetry and periodicity,” Opt. Lasers Eng. 52, 195–200 (2014).

[Crossref]

Z. Wang, D. A. Nguyen, and J. C. Barnes, “Some practical considerations in fringe projection profilometry,” Opt. Lasers Eng. 48(2), 218–225 (2010).

[Crossref]

S. Gorthi and P. Rastogi, “Fringe Projection Techniques: Whither we are?” Opt. Lasers Eng. 48(2), 133–140 (2010).

[Crossref]

T. Hoang, B. Pan, D. Nguyen, and Z. Wang, “Generic gamma correction for accuracy enhancement in fringe-projection profilometry,” Opt. Lett. 35(12), 1992–1994 (2010).

[Crossref]

Z. Li and Y. Li, “Gamma-distorted fringe image modeling and accurate gamma correction for fast phase measuring profilometry,” Opt. Lett. 36(2), 154–156 (2011).

[Crossref]

W. Lohry and S. Zhang, “Genetic method to optimize binary dithering technique for high-quality fringe generation,” Opt. Lett. 38(4), 540 (2013).

[Crossref]

S. Lei and S. Zhang, “Flexible 3-D shape measurement using projector defocusing,” Opt. Lett. 34(20), 3080–3082 (2009).

[Crossref]

Y. Wang and S. Zhang, “Optimal pulse width modulation for sinusoidal fringe generation with projector defocusing,” Opt. Lett. 35(24), 4121–4123 (2010).

[Crossref]

B. Pan, Q. Kemao, L. Huang, and A. Asundi, “Phase error analysis and compensation for nonsinusoidal waveforms in phase-shifting digital fringe projection profilometry,” Opt. Lett. 34(4), 416–418 (2009).

J. Salvi, S. Fernandez, T. Pribanic, and X. Llado, “A state of the art in structured light patterns for surface profilometry,” Pattern Recognit. 43(8), 2666–2680 (2010).

[Crossref]

G. H. Notni and G. Notni, “Digital fringe projection in 3D shape measurement: an error analysis,” Proc. SPIE 5144, 372–380 (2003).

[Crossref]

M. J. Baker, J. Xi, and J. F. Chicharo, “Elimination of gamma non-linear luminance effects for digital video projection phase measuring profilometers,” in 4th IEEE International Symposium on Electronic Design, Test and Applications (IEEE, 2008), pp. 496–501.