Abstract

We have built a system capable of measuring the step response of III – V electronic devices on the picosecond time scale, with no alteration in device design or epitaxy. To switch on the device under test (DUT), we have designed and fabricated a new type of photoconductor, the recessed-ohmic photoconductor, which swings 0.45 V with a 2-ps rise time and maintains constant output voltage for 100 ps. This switch is monolithically integrated with the DUT. To measure the output current of the DUT, we have built a Ti:sapphire-laser-based pump – probe direct electro-optic sampling system that has a minimum detectable voltage of 70μV/Hz and a measurement bandwidth of 750 GHz. The overall system, comprised of the recessed ohmic photoconductor and the electro-optic sampling system, can be used to measure the step response of III – V electronic devices on the picosecond time scale.

© 1995 Optical Society of America

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