Abstract

Laser-induced damage of fused silica with different parameters was studied by means of photothermal spectroscopy and optical microscope. The development of damage area with laser parameters was discussed, and the photothermal absorption signal and its stability of the damaged pits were studied. It was found that the signal is stronger when the fused silica material was molten or broken. The laser damage area visibility ratio is defined. The change of the laser damage area visibility ratio with laser parameters is studied, and it is suggested that it can be used as a parameter to indicate the degree of damage in engineering.

© 2019 Optical Society of America under the terms of the OSA Open Access Publishing Agreement

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2018 (5)

2017 (2)

M. Veinhard, O. Bonville, R. Courchinoux, R. Parreault, J. Y. Natoli, and L. Lamaignere, “Quantification of laser-induced damage growth using fractal analysis,” Opt. Lett. 42(24), 5078–5081 (2017).
[Crossref]

B. Bussiere, N. Sanner, M. Sentis, and O. Uteza, “Importance of surface topography on pulsed laser-induced damage threshold of Sapphire crystals,” Sci. Rep. 7(1), 1249 (2017).
[Crossref]

2015 (2)

J. Chen, J. T. Dong, and Z. L. Wu, “In-situ investigation of damage processes on fused silica induced by a pulsed 355 nm laser with high repetition rate,” Proc. SPIE 9345, 93450A (2015).
[Crossref]

M. Chambonneau, M. Chanal, S. Reyne, G. Duchateau, J. Y. Natoli, and L. Lamaignere, “Investigations on laser damage growth in fused silica with simultaneous wavelength irradiation,” Appl. Opt. 54(6), 1463–1470 (2015).
[Crossref]

2014 (3)

2013 (1)

J. Chen, J. T. Dong, and Z. L. Wu, “Development of a “turn-key” system for weak absorption measurement and analysis,” Proc. SPIE 8786, 87861M (2013).
[Crossref]

2012 (2)

T. A. Laurence, J. D. Bude, S. Ly, N. Shen, and M. D. Feit, “Extracting the distribution of laser damage precursors on fused silica surfaces for 351 nm, 3 ns laser pulses at high fluences (20-150 J/cm2),” Opt. Express 20(10), 11561–11573 (2012).
[Crossref]

A. R. Warrier, T. H. Sajeesh, C. S. Kartha, and K. P. Vijayakumar, “Determination of thermal and electronic carrier transport properties of SnS thinfilms using photothermal beam deflection technique,” Mater. Res. Bull. 47(11), 3758–3763 (2012).
[Crossref]

2009 (2)

T. A. Laurence, J. D. Bude, N. Shen, T. Feldman, P. E. Miller, W. A. Steele, and T. Suratwala, “Metallic-like photoluminescence and absorption in fused silica surface flaws,” Appl. Phys. Lett. 94(15), 151114 (2009).
[Crossref]

J. Neauport, C. Ambard, P. Cormont, N. Darbois, J. Destribats, C. Luitot, and O. Rondeau, “Subsurface damage measurement of ground fused silica parts by HF etching techniques,” Opt. Express 17(22), 20448–20456 (2009).
[Crossref]

2007 (2)

2006 (1)

G. J. Exarhos, M. A. Norton, A. H. Guenther, E. E. Donohue, M. D. Feit, K. L. Lewis, D. Ristau, R. P. Hackel, W. G. Hollingsworth, M. J. Soileau, C. J. Stolz, A. M. Rubenchik, and M. L. Spaeth, “Growth of laser damage on the input surface of SiO2 at 351 nm,” Proc. SPIE 6403, 64030H (2006).
[Crossref]

2005 (3)

2004 (1)

J. H. Campbell, R. A. Hawley-Fedder, C. J. Stolz, J. A. Menapace, M. R. Borden, P. K. Whitman, J. Yu, M. Runkel, M. O. Riley, M. D. Feit, and R. P. Hackel, “NIF optical materials and fabrication technologies: an overview,” Proc. SPIE 5341, 84–101 (2004).
[Crossref]

2002 (2)

A. M. Rubenchik and M. D. Feit, “Initiation, growth, and mitigation of UV-laser-induced damage in fused silica,” Proc. SPIE 4679, 79–95 (2002).
[Crossref]

L. W. Hrubesh, M. A. Norton, W. A. Molander, E. E. Donohue, S. M. Maricle, B. M. Penetrante, R. M. Brusasco, W. Grundler, J. A. Butler, J. W. Carr, R. M. Hill, L. J. Summers, M. D. Feit, A. Rubenchik, M. H. Key, P. J. Wegner, A. K. Burnham, L. A. Hackel, and M. R. Kozlowski, “Methods for mitigating surface damage growth on NIF final optics,” Proc. SPIE 4679, 23–33 (2002).
[Crossref]

2001 (4)

L. Skuja, H. Hosono, and M. Hirano, “Laser-induced color centers in silica,” Proc. SPIE 4347, 155–168 (2001).
[Crossref]

H. S. Peng, X. M. Zhang, X. F. Wei, W. G. Zheng, F. Jing, Z. Sui, Q. Zhao, D. Y. Fan, Z. Q. Ling, and J. Q. Zhou, “Design of 60-kJ SG-III laser facility and related technology development,” Proc. SPIE 4424, 98–103 (2001).
[Crossref]

M. A. Norton, L. W. Hrubesh, Z. Wu, E. E. Donohue, M. D. Feit, M. R. Kozlowski, D. Milam, K. P. Neeb, W. A. Moiander, A. M. Rubenchik, W. D. Sell, and P. Wegner, “Growth of laser initiated damage in fused silica at 351 nm,” Proc. SPIE 4347, 468 (2001).
[Crossref]

Y. Génin, A. Salleo, T. V. Pistor, and L. L. Chase, “Role of light intensification by cracks in optical breakdown on surfaces,” J. Opt. Soc. Am. A 18(10), 2607 (2001).
[Crossref]

1999 (2)

M. L. Andre, “The French Megajoule Laser Project (LMJ),” Fusion Eng. Des. 44(1-4), 43–49 (1999).
[Crossref]

G. Y. Xiao, D. Y. Fan, S. J. Wang, Z. Q. Lin, Y. Gu, J. Q. Zhu, Y. X. Zhen, J. Zhu, F. Q. Liu, S. H. Chen, Q. H. Chen, G. L. Huang, and X. M. Deng, “SG-II solid state laser ICF system,” Proc. SPIE 3492, 890–895 (1999).
[Crossref]

1997 (1)

Z. L. Wu, M. Thomsen, P. K. Kuo, Y. S. Lu, C. Stolz, and M. Kozlowski, “Photothermal characterization of optical thin film coatings,” Opt. Eng. 36(1), 251–262 (1997).
[Crossref]

1995 (1)

1994 (1)

M. Commandré, P. Roche, J.-P. Borgogno, and G. Aibrand, “Surface contamination of bare substrates- mapping of absorption and influence on depostited thin films,” Proc. SPIE 2253, 982–992 (1994).
[Crossref]

1984 (1)

L. B. Glebov, O. M. Efimov, G. T. Petrovskii, and P. N. Rogovtsev, “Influence of the mode composition of laser radiation on the optical breakdown of silicate glasses,” Quantum Electron. 14(2), 226–229 (1984).
[Crossref]

Aibrand, G.

M. Commandré, P. Roche, J.-P. Borgogno, and G. Aibrand, “Surface contamination of bare substrates- mapping of absorption and influence on depostited thin films,” Proc. SPIE 2253, 982–992 (1994).
[Crossref]

Ambard, C.

Andre, M. L.

M. L. Andre, “The French Megajoule Laser Project (LMJ),” Fusion Eng. Des. 44(1-4), 43–49 (1999).
[Crossref]

Auerbach, J. M.

Baxamusa, S.

Benett, W. J.

Bercegol, H.

Bertussi, B.

B. Bertussi, J.-Y. Natoli, M. Commandre, J. L. Rullier, F. Bonneau, P. Combis, and P. Bouchut, “Photothermal investigation of the laser-induced modification of a single gold nano-particle in a silica film,” Opt. Commun. 254(4-6), 299–309 (2005).
[Crossref]

Birolleau, J.-C.

Bonneau, F.

B. Bertussi, J.-Y. Natoli, M. Commandre, J. L. Rullier, F. Bonneau, P. Combis, and P. Bouchut, “Photothermal investigation of the laser-induced modification of a single gold nano-particle in a silica film,” Opt. Commun. 254(4-6), 299–309 (2005).
[Crossref]

Bonville, O.

Borden, M. R.

J. H. Campbell, R. A. Hawley-Fedder, C. J. Stolz, J. A. Menapace, M. R. Borden, P. K. Whitman, J. Yu, M. Runkel, M. O. Riley, M. D. Feit, and R. P. Hackel, “NIF optical materials and fabrication technologies: an overview,” Proc. SPIE 5341, 84–101 (2004).
[Crossref]

Borgogno, J.-P.

M. Commandré, P. Roche, J.-P. Borgogno, and G. Aibrand, “Surface contamination of bare substrates- mapping of absorption and influence on depostited thin films,” Proc. SPIE 2253, 982–992 (1994).
[Crossref]

Bouchut, P.

B. Bertussi, J.-Y. Natoli, M. Commandre, J. L. Rullier, F. Bonneau, P. Combis, and P. Bouchut, “Photothermal investigation of the laser-induced modification of a single gold nano-particle in a silica film,” Opt. Commun. 254(4-6), 299–309 (2005).
[Crossref]

Bowers, M. W.

Brusasco, R. M.

L. W. Hrubesh, M. A. Norton, W. A. Molander, E. E. Donohue, S. M. Maricle, B. M. Penetrante, R. M. Brusasco, W. Grundler, J. A. Butler, J. W. Carr, R. M. Hill, L. J. Summers, M. D. Feit, A. Rubenchik, M. H. Key, P. J. Wegner, A. K. Burnham, L. A. Hackel, and M. R. Kozlowski, “Methods for mitigating surface damage growth on NIF final optics,” Proc. SPIE 4679, 23–33 (2002).
[Crossref]

Bude, J.

Bude, J. D.

T. A. Laurence, J. D. Bude, S. Ly, N. Shen, and M. D. Feit, “Extracting the distribution of laser damage precursors on fused silica surfaces for 351 nm, 3 ns laser pulses at high fluences (20-150 J/cm2),” Opt. Express 20(10), 11561–11573 (2012).
[Crossref]

T. A. Laurence, J. D. Bude, N. Shen, T. Feldman, P. E. Miller, W. A. Steele, and T. Suratwala, “Metallic-like photoluminescence and absorption in fused silica surface flaws,” Appl. Phys. Lett. 94(15), 151114 (2009).
[Crossref]

Burke, M. W.

R. A. Negres, M. W. Burke, S. B. Sutton, P. DeMange, M. D. Feit, and S. G. Demos, “Evaluation of UV absorption coefficient in laser-modified fused silica,” Appl. Phys. Lett. 90(6), 061115 (2007).
[Crossref]

Burnham, A. K.

L. W. Hrubesh, M. A. Norton, W. A. Molander, E. E. Donohue, S. M. Maricle, B. M. Penetrante, R. M. Brusasco, W. Grundler, J. A. Butler, J. W. Carr, R. M. Hill, L. J. Summers, M. D. Feit, A. Rubenchik, M. H. Key, P. J. Wegner, A. K. Burnham, L. A. Hackel, and M. R. Kozlowski, “Methods for mitigating surface damage growth on NIF final optics,” Proc. SPIE 4679, 23–33 (2002).
[Crossref]

Bussiere, B.

B. Bussiere, N. Sanner, M. Sentis, and O. Uteza, “Importance of surface topography on pulsed laser-induced damage threshold of Sapphire crystals,” Sci. Rep. 7(1), 1249 (2017).
[Crossref]

Butler, J. A.

L. W. Hrubesh, M. A. Norton, W. A. Molander, E. E. Donohue, S. M. Maricle, B. M. Penetrante, R. M. Brusasco, W. Grundler, J. A. Butler, J. W. Carr, R. M. Hill, L. J. Summers, M. D. Feit, A. Rubenchik, M. H. Key, P. J. Wegner, A. K. Burnham, L. A. Hackel, and M. R. Kozlowski, “Methods for mitigating surface damage growth on NIF final optics,” Proc. SPIE 4679, 23–33 (2002).
[Crossref]

Campbell, J. H.

J. H. Campbell, R. A. Hawley-Fedder, C. J. Stolz, J. A. Menapace, M. R. Borden, P. K. Whitman, J. Yu, M. Runkel, M. O. Riley, M. D. Feit, and R. P. Hackel, “NIF optical materials and fabrication technologies: an overview,” Proc. SPIE 5341, 84–101 (2004).
[Crossref]

Carr, C. W.

Carr, J. W.

L. W. Hrubesh, M. A. Norton, W. A. Molander, E. E. Donohue, S. M. Maricle, B. M. Penetrante, R. M. Brusasco, W. Grundler, J. A. Butler, J. W. Carr, R. M. Hill, L. J. Summers, M. D. Feit, A. Rubenchik, M. H. Key, P. J. Wegner, A. K. Burnham, L. A. Hackel, and M. R. Kozlowski, “Methods for mitigating surface damage growth on NIF final optics,” Proc. SPIE 4679, 23–33 (2002).
[Crossref]

Carr, W.

Chambonneau, M.

Chanal, M.

Chase, L. L.

Chen, J.

J. Chen, J. T. Dong, and Z. L. Wu, “In-situ investigation of damage processes on fused silica induced by a pulsed 355 nm laser with high repetition rate,” Proc. SPIE 9345, 93450A (2015).
[Crossref]

J. Chen, J. T. Dong, and Z. L. Wu, “Development of a “turn-key” system for weak absorption measurement and analysis,” Proc. SPIE 8786, 87861M (2013).
[Crossref]

Chen, Q. H.

G. Y. Xiao, D. Y. Fan, S. J. Wang, Z. Q. Lin, Y. Gu, J. Q. Zhu, Y. X. Zhen, J. Zhu, F. Q. Liu, S. H. Chen, Q. H. Chen, G. L. Huang, and X. M. Deng, “SG-II solid state laser ICF system,” Proc. SPIE 3492, 890–895 (1999).
[Crossref]

Chen, S. H.

G. Y. Xiao, D. Y. Fan, S. J. Wang, Z. Q. Lin, Y. Gu, J. Q. Zhu, Y. X. Zhen, J. Zhu, F. Q. Liu, S. H. Chen, Q. H. Chen, G. L. Huang, and X. M. Deng, “SG-II solid state laser ICF system,” Proc. SPIE 3492, 890–895 (1999).
[Crossref]

Combis, P.

B. Bertussi, J.-Y. Natoli, M. Commandre, J. L. Rullier, F. Bonneau, P. Combis, and P. Bouchut, “Photothermal investigation of the laser-induced modification of a single gold nano-particle in a silica film,” Opt. Commun. 254(4-6), 299–309 (2005).
[Crossref]

Commandre, M.

B. Bertussi, J.-Y. Natoli, M. Commandre, J. L. Rullier, F. Bonneau, P. Combis, and P. Bouchut, “Photothermal investigation of the laser-induced modification of a single gold nano-particle in a silica film,” Opt. Commun. 254(4-6), 299–309 (2005).
[Crossref]

Commandré, M.

M. Commandré, P. Roche, J.-P. Borgogno, and G. Aibrand, “Surface contamination of bare substrates- mapping of absorption and influence on depostited thin films,” Proc. SPIE 2253, 982–992 (1994).
[Crossref]

Cormont, P.

Courchinoux, R.

Cross, D.

Cross, D. A.

Darbois, N.

DeMange, P.

R. A. Negres, M. W. Burke, S. B. Sutton, P. DeMange, M. D. Feit, and S. G. Demos, “Evaluation of UV absorption coefficient in laser-modified fused silica,” Appl. Phys. Lett. 90(6), 061115 (2007).
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Demos, S. G.

R. A. Negres, M. W. Burke, S. B. Sutton, P. DeMange, M. D. Feit, and S. G. Demos, “Evaluation of UV absorption coefficient in laser-modified fused silica,” Appl. Phys. Lett. 90(6), 061115 (2007).
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Deng, X. M.

G. Y. Xiao, D. Y. Fan, S. J. Wang, Z. Q. Lin, Y. Gu, J. Q. Zhu, Y. X. Zhen, J. Zhu, F. Q. Liu, S. H. Chen, Q. H. Chen, G. L. Huang, and X. M. Deng, “SG-II solid state laser ICF system,” Proc. SPIE 3492, 890–895 (1999).
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Destribats, J.

Dixit, S. N.

Dong, J. T.

J. Chen, J. T. Dong, and Z. L. Wu, “In-situ investigation of damage processes on fused silica induced by a pulsed 355 nm laser with high repetition rate,” Proc. SPIE 9345, 93450A (2015).
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J. Chen, J. T. Dong, and Z. L. Wu, “Development of a “turn-key” system for weak absorption measurement and analysis,” Proc. SPIE 8786, 87861M (2013).
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Donohue, E. E.

G. J. Exarhos, M. A. Norton, A. H. Guenther, E. E. Donohue, M. D. Feit, K. L. Lewis, D. Ristau, R. P. Hackel, W. G. Hollingsworth, M. J. Soileau, C. J. Stolz, A. M. Rubenchik, and M. L. Spaeth, “Growth of laser damage on the input surface of SiO2 at 351 nm,” Proc. SPIE 6403, 64030H (2006).
[Crossref]

L. W. Hrubesh, M. A. Norton, W. A. Molander, E. E. Donohue, S. M. Maricle, B. M. Penetrante, R. M. Brusasco, W. Grundler, J. A. Butler, J. W. Carr, R. M. Hill, L. J. Summers, M. D. Feit, A. Rubenchik, M. H. Key, P. J. Wegner, A. K. Burnham, L. A. Hackel, and M. R. Kozlowski, “Methods for mitigating surface damage growth on NIF final optics,” Proc. SPIE 4679, 23–33 (2002).
[Crossref]

M. A. Norton, L. W. Hrubesh, Z. Wu, E. E. Donohue, M. D. Feit, M. R. Kozlowski, D. Milam, K. P. Neeb, W. A. Moiander, A. M. Rubenchik, W. D. Sell, and P. Wegner, “Growth of laser initiated damage in fused silica at 351 nm,” Proc. SPIE 4347, 468 (2001).
[Crossref]

Duchateau, G.

Efimov, O. M.

L. B. Glebov, O. M. Efimov, G. T. Petrovskii, and P. N. Rogovtsev, “Influence of the mode composition of laser radiation on the optical breakdown of silicate glasses,” Quantum Electron. 14(2), 226–229 (1984).
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Erbert, G. V.

Exarhos, G. J.

G. J. Exarhos, M. A. Norton, A. H. Guenther, E. E. Donohue, M. D. Feit, K. L. Lewis, D. Ristau, R. P. Hackel, W. G. Hollingsworth, M. J. Soileau, C. J. Stolz, A. M. Rubenchik, and M. L. Spaeth, “Growth of laser damage on the input surface of SiO2 at 351 nm,” Proc. SPIE 6403, 64030H (2006).
[Crossref]

Fan, D. Y.

H. S. Peng, X. M. Zhang, X. F. Wei, W. G. Zheng, F. Jing, Z. Sui, Q. Zhao, D. Y. Fan, Z. Q. Ling, and J. Q. Zhou, “Design of 60-kJ SG-III laser facility and related technology development,” Proc. SPIE 4424, 98–103 (2001).
[Crossref]

G. Y. Xiao, D. Y. Fan, S. J. Wang, Z. Q. Lin, Y. Gu, J. Q. Zhu, Y. X. Zhen, J. Zhu, F. Q. Liu, S. H. Chen, Q. H. Chen, G. L. Huang, and X. M. Deng, “SG-II solid state laser ICF system,” Proc. SPIE 3492, 890–895 (1999).
[Crossref]

Feit, M. D.

T. A. Laurence, J. D. Bude, S. Ly, N. Shen, and M. D. Feit, “Extracting the distribution of laser damage precursors on fused silica surfaces for 351 nm, 3 ns laser pulses at high fluences (20-150 J/cm2),” Opt. Express 20(10), 11561–11573 (2012).
[Crossref]

R. A. Negres, M. W. Burke, S. B. Sutton, P. DeMange, M. D. Feit, and S. G. Demos, “Evaluation of UV absorption coefficient in laser-modified fused silica,” Appl. Phys. Lett. 90(6), 061115 (2007).
[Crossref]

G. J. Exarhos, M. A. Norton, A. H. Guenther, E. E. Donohue, M. D. Feit, K. L. Lewis, D. Ristau, R. P. Hackel, W. G. Hollingsworth, M. J. Soileau, C. J. Stolz, A. M. Rubenchik, and M. L. Spaeth, “Growth of laser damage on the input surface of SiO2 at 351 nm,” Proc. SPIE 6403, 64030H (2006).
[Crossref]

J. H. Campbell, R. A. Hawley-Fedder, C. J. Stolz, J. A. Menapace, M. R. Borden, P. K. Whitman, J. Yu, M. Runkel, M. O. Riley, M. D. Feit, and R. P. Hackel, “NIF optical materials and fabrication technologies: an overview,” Proc. SPIE 5341, 84–101 (2004).
[Crossref]

A. M. Rubenchik and M. D. Feit, “Initiation, growth, and mitigation of UV-laser-induced damage in fused silica,” Proc. SPIE 4679, 79–95 (2002).
[Crossref]

L. W. Hrubesh, M. A. Norton, W. A. Molander, E. E. Donohue, S. M. Maricle, B. M. Penetrante, R. M. Brusasco, W. Grundler, J. A. Butler, J. W. Carr, R. M. Hill, L. J. Summers, M. D. Feit, A. Rubenchik, M. H. Key, P. J. Wegner, A. K. Burnham, L. A. Hackel, and M. R. Kozlowski, “Methods for mitigating surface damage growth on NIF final optics,” Proc. SPIE 4679, 23–33 (2002).
[Crossref]

M. A. Norton, L. W. Hrubesh, Z. Wu, E. E. Donohue, M. D. Feit, M. R. Kozlowski, D. Milam, K. P. Neeb, W. A. Moiander, A. M. Rubenchik, W. D. Sell, and P. Wegner, “Growth of laser initiated damage in fused silica at 351 nm,” Proc. SPIE 4347, 468 (2001).
[Crossref]

Feldman, T.

T. A. Laurence, J. D. Bude, N. Shen, T. Feldman, P. E. Miller, W. A. Steele, and T. Suratwala, “Metallic-like photoluminescence and absorption in fused silica surface flaws,” Appl. Phys. Lett. 94(15), 151114 (2009).
[Crossref]

Génin, Y.

Glebov, L. B.

L. B. Glebov, O. M. Efimov, G. T. Petrovskii, and P. N. Rogovtsev, “Influence of the mode composition of laser radiation on the optical breakdown of silicate glasses,” Quantum Electron. 14(2), 226–229 (1984).
[Crossref]

Grua, P.

Grundler, W.

L. W. Hrubesh, M. A. Norton, W. A. Molander, E. E. Donohue, S. M. Maricle, B. M. Penetrante, R. M. Brusasco, W. Grundler, J. A. Butler, J. W. Carr, R. M. Hill, L. J. Summers, M. D. Feit, A. Rubenchik, M. H. Key, P. J. Wegner, A. K. Burnham, L. A. Hackel, and M. R. Kozlowski, “Methods for mitigating surface damage growth on NIF final optics,” Proc. SPIE 4679, 23–33 (2002).
[Crossref]

Gu, Y.

G. Y. Xiao, D. Y. Fan, S. J. Wang, Z. Q. Lin, Y. Gu, J. Q. Zhu, Y. X. Zhen, J. Zhu, F. Q. Liu, S. H. Chen, Q. H. Chen, G. L. Huang, and X. M. Deng, “SG-II solid state laser ICF system,” Proc. SPIE 3492, 890–895 (1999).
[Crossref]

Guenther, A. H.

G. J. Exarhos, M. A. Norton, A. H. Guenther, E. E. Donohue, M. D. Feit, K. L. Lewis, D. Ristau, R. P. Hackel, W. G. Hollingsworth, M. J. Soileau, C. J. Stolz, A. M. Rubenchik, and M. L. Spaeth, “Growth of laser damage on the input surface of SiO2 at 351 nm,” Proc. SPIE 6403, 64030H (2006).
[Crossref]

Hackel, L. A.

L. W. Hrubesh, M. A. Norton, W. A. Molander, E. E. Donohue, S. M. Maricle, B. M. Penetrante, R. M. Brusasco, W. Grundler, J. A. Butler, J. W. Carr, R. M. Hill, L. J. Summers, M. D. Feit, A. Rubenchik, M. H. Key, P. J. Wegner, A. K. Burnham, L. A. Hackel, and M. R. Kozlowski, “Methods for mitigating surface damage growth on NIF final optics,” Proc. SPIE 4679, 23–33 (2002).
[Crossref]

Hackel, R. P.

G. J. Exarhos, M. A. Norton, A. H. Guenther, E. E. Donohue, M. D. Feit, K. L. Lewis, D. Ristau, R. P. Hackel, W. G. Hollingsworth, M. J. Soileau, C. J. Stolz, A. M. Rubenchik, and M. L. Spaeth, “Growth of laser damage on the input surface of SiO2 at 351 nm,” Proc. SPIE 6403, 64030H (2006).
[Crossref]

J. H. Campbell, R. A. Hawley-Fedder, C. J. Stolz, J. A. Menapace, M. R. Borden, P. K. Whitman, J. Yu, M. Runkel, M. O. Riley, M. D. Feit, and R. P. Hackel, “NIF optical materials and fabrication technologies: an overview,” Proc. SPIE 5341, 84–101 (2004).
[Crossref]

Hawley-Fedder, R. A.

J. H. Campbell, R. A. Hawley-Fedder, C. J. Stolz, J. A. Menapace, M. R. Borden, P. K. Whitman, J. Yu, M. Runkel, M. O. Riley, M. D. Feit, and R. P. Hackel, “NIF optical materials and fabrication technologies: an overview,” Proc. SPIE 5341, 84–101 (2004).
[Crossref]

Haynam, C. A.

Heestand, G. M.

Henesian, M. A.

Hermann, M. R.

Hill, R. M.

L. W. Hrubesh, M. A. Norton, W. A. Molander, E. E. Donohue, S. M. Maricle, B. M. Penetrante, R. M. Brusasco, W. Grundler, J. A. Butler, J. W. Carr, R. M. Hill, L. J. Summers, M. D. Feit, A. Rubenchik, M. H. Key, P. J. Wegner, A. K. Burnham, L. A. Hackel, and M. R. Kozlowski, “Methods for mitigating surface damage growth on NIF final optics,” Proc. SPIE 4679, 23–33 (2002).
[Crossref]

Hirano, M.

L. Skuja, H. Hosono, and M. Hirano, “Laser-induced color centers in silica,” Proc. SPIE 4347, 155–168 (2001).
[Crossref]

Hollingsworth, W. G.

G. J. Exarhos, M. A. Norton, A. H. Guenther, E. E. Donohue, M. D. Feit, K. L. Lewis, D. Ristau, R. P. Hackel, W. G. Hollingsworth, M. J. Soileau, C. J. Stolz, A. M. Rubenchik, and M. L. Spaeth, “Growth of laser damage on the input surface of SiO2 at 351 nm,” Proc. SPIE 6403, 64030H (2006).
[Crossref]

Hosono, H.

L. Skuja, H. Hosono, and M. Hirano, “Laser-induced color centers in silica,” Proc. SPIE 4347, 155–168 (2001).
[Crossref]

Hrubesh, L. W.

L. W. Hrubesh, M. A. Norton, W. A. Molander, E. E. Donohue, S. M. Maricle, B. M. Penetrante, R. M. Brusasco, W. Grundler, J. A. Butler, J. W. Carr, R. M. Hill, L. J. Summers, M. D. Feit, A. Rubenchik, M. H. Key, P. J. Wegner, A. K. Burnham, L. A. Hackel, and M. R. Kozlowski, “Methods for mitigating surface damage growth on NIF final optics,” Proc. SPIE 4679, 23–33 (2002).
[Crossref]

M. A. Norton, L. W. Hrubesh, Z. Wu, E. E. Donohue, M. D. Feit, M. R. Kozlowski, D. Milam, K. P. Neeb, W. A. Moiander, A. M. Rubenchik, W. D. Sell, and P. Wegner, “Growth of laser initiated damage in fused silica at 351 nm,” Proc. SPIE 4347, 468 (2001).
[Crossref]

Huang, G. L.

G. Y. Xiao, D. Y. Fan, S. J. Wang, Z. Q. Lin, Y. Gu, J. Q. Zhu, Y. X. Zhen, J. Zhu, F. Q. Liu, S. H. Chen, Q. H. Chen, G. L. Huang, and X. M. Deng, “SG-II solid state laser ICF system,” Proc. SPIE 3492, 890–895 (1999).
[Crossref]

Huang, J.

H. J. Liu, X. Ye, X. D. Zhou, J. Huang, F. R. Wang, X. Y. Zhou, W. D. Wu, X. D. Jiang, Z. Sui, and W. G. Zheng, “Subsurface defects characterization and laser damage performance of fused silica optics during HF-etched process,” Opt. Mater. 36(5), 855–860 (2014).
[Crossref]

Jancaitis, K. S.

Jiang, X. D.

H. J. Liu, X. Ye, X. D. Zhou, J. Huang, F. R. Wang, X. Y. Zhou, W. D. Wu, X. D. Jiang, Z. Sui, and W. G. Zheng, “Subsurface defects characterization and laser damage performance of fused silica optics during HF-etched process,” Opt. Mater. 36(5), 855–860 (2014).
[Crossref]

Jing, F.

H. S. Peng, X. M. Zhang, X. F. Wei, W. G. Zheng, F. Jing, Z. Sui, Q. Zhao, D. Y. Fan, Z. Q. Ling, and J. Q. Zhou, “Design of 60-kJ SG-III laser facility and related technology development,” Proc. SPIE 4424, 98–103 (2001).
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Ju, X.

Kartha, C. S.

A. R. Warrier, T. H. Sajeesh, C. S. Kartha, and K. P. Vijayakumar, “Determination of thermal and electronic carrier transport properties of SnS thinfilms using photothermal beam deflection technique,” Mater. Res. Bull. 47(11), 3758–3763 (2012).
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Key, M. H.

L. W. Hrubesh, M. A. Norton, W. A. Molander, E. E. Donohue, S. M. Maricle, B. M. Penetrante, R. M. Brusasco, W. Grundler, J. A. Butler, J. W. Carr, R. M. Hill, L. J. Summers, M. D. Feit, A. Rubenchik, M. H. Key, P. J. Wegner, A. K. Burnham, L. A. Hackel, and M. R. Kozlowski, “Methods for mitigating surface damage growth on NIF final optics,” Proc. SPIE 4679, 23–33 (2002).
[Crossref]

Kozlowski, M.

Z. L. Wu, M. Thomsen, P. K. Kuo, Y. S. Lu, C. Stolz, and M. Kozlowski, “Photothermal characterization of optical thin film coatings,” Opt. Eng. 36(1), 251–262 (1997).
[Crossref]

Kozlowski, M. R.

M. R. Kozlowski, R. Mouser, S. Maricle, P. Wegner, and T. Weiland, “Laser Damage performance of fused silica optical components measured on the Beamlet Laser at 351 nm,” Proc. SPIE 26(9), 11744–11755 (2018).
[Crossref]

L. W. Hrubesh, M. A. Norton, W. A. Molander, E. E. Donohue, S. M. Maricle, B. M. Penetrante, R. M. Brusasco, W. Grundler, J. A. Butler, J. W. Carr, R. M. Hill, L. J. Summers, M. D. Feit, A. Rubenchik, M. H. Key, P. J. Wegner, A. K. Burnham, L. A. Hackel, and M. R. Kozlowski, “Methods for mitigating surface damage growth on NIF final optics,” Proc. SPIE 4679, 23–33 (2002).
[Crossref]

M. A. Norton, L. W. Hrubesh, Z. Wu, E. E. Donohue, M. D. Feit, M. R. Kozlowski, D. Milam, K. P. Neeb, W. A. Moiander, A. M. Rubenchik, W. D. Sell, and P. Wegner, “Growth of laser initiated damage in fused silica at 351 nm,” Proc. SPIE 4347, 468 (2001).
[Crossref]

Kuo, P. K.

Z. L. Wu, M. Thomsen, P. K. Kuo, Y. S. Lu, C. Stolz, and M. Kozlowski, “Photothermal characterization of optical thin film coatings,” Opt. Eng. 36(1), 251–262 (1997).
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Lamaignere, L.

Lamaignère, L.

P. Grua, L. Lamaignère, M. Chambonneau, R. Courchinoux, and J. Néauport, “Nanosecond laser damage initiation at 0.35  µm in fused silica,” Opt. Lett. 43(11), 2692 (2018).
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M. Chambonneau and L. Lamaignère, “Multi-wavelength growth of nanosecond laser-induced surface damage on fused silica gratings,” Sci. Rep. 8(1), 891 (2018).
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Laurence, T.

Laurence, T. A.

T. A. Laurence, J. D. Bude, S. Ly, N. Shen, and M. D. Feit, “Extracting the distribution of laser damage precursors on fused silica surfaces for 351 nm, 3 ns laser pulses at high fluences (20-150 J/cm2),” Opt. Express 20(10), 11561–11573 (2012).
[Crossref]

T. A. Laurence, J. D. Bude, N. Shen, T. Feldman, P. E. Miller, W. A. Steele, and T. Suratwala, “Metallic-like photoluminescence and absorption in fused silica surface flaws,” Appl. Phys. Lett. 94(15), 151114 (2009).
[Crossref]

Lewis, K. L.

G. J. Exarhos, M. A. Norton, A. H. Guenther, E. E. Donohue, M. D. Feit, K. L. Lewis, D. Ristau, R. P. Hackel, W. G. Hollingsworth, M. J. Soileau, C. J. Stolz, A. M. Rubenchik, and M. L. Spaeth, “Growth of laser damage on the input surface of SiO2 at 351 nm,” Proc. SPIE 6403, 64030H (2006).
[Crossref]

Li, X. C.

Li, Y.

Liao, Z. M.

Lin, Z. Q.

G. Y. Xiao, D. Y. Fan, S. J. Wang, Z. Q. Lin, Y. Gu, J. Q. Zhu, Y. X. Zhen, J. Zhu, F. Q. Liu, S. H. Chen, Q. H. Chen, G. L. Huang, and X. M. Deng, “SG-II solid state laser ICF system,” Proc. SPIE 3492, 890–895 (1999).
[Crossref]

Ling, Z. Q.

H. S. Peng, X. M. Zhang, X. F. Wei, W. G. Zheng, F. Jing, Z. Sui, Q. Zhao, D. Y. Fan, Z. Q. Ling, and J. Q. Zhou, “Design of 60-kJ SG-III laser facility and related technology development,” Proc. SPIE 4424, 98–103 (2001).
[Crossref]

Liu, B. A.

Liu, C.

Liu, F. Q.

G. Y. Xiao, D. Y. Fan, S. J. Wang, Z. Q. Lin, Y. Gu, J. Q. Zhu, Y. X. Zhen, J. Zhu, F. Q. Liu, S. H. Chen, Q. H. Chen, G. L. Huang, and X. M. Deng, “SG-II solid state laser ICF system,” Proc. SPIE 3492, 890–895 (1999).
[Crossref]

Liu, H. J.

H. J. Liu, X. Ye, X. D. Zhou, J. Huang, F. R. Wang, X. Y. Zhou, W. D. Wu, X. D. Jiang, Z. Sui, and W. G. Zheng, “Subsurface defects characterization and laser damage performance of fused silica optics during HF-etched process,” Opt. Mater. 36(5), 855–860 (2014).
[Crossref]

Loge, J. M.

Lu, Y. S.

Z. L. Wu, M. Thomsen, P. K. Kuo, Y. S. Lu, C. Stolz, and M. Kozlowski, “Photothermal characterization of optical thin film coatings,” Opt. Eng. 36(1), 251–262 (1997).
[Crossref]

Luitot, C.

Ly, S.

Maitland, D. J.

Manes, K. R.

Maricle, S.

M. R. Kozlowski, R. Mouser, S. Maricle, P. Wegner, and T. Weiland, “Laser Damage performance of fused silica optical components measured on the Beamlet Laser at 351 nm,” Proc. SPIE 26(9), 11744–11755 (2018).
[Crossref]

Maricle, S. M.

L. W. Hrubesh, M. A. Norton, W. A. Molander, E. E. Donohue, S. M. Maricle, B. M. Penetrante, R. M. Brusasco, W. Grundler, J. A. Butler, J. W. Carr, R. M. Hill, L. J. Summers, M. D. Feit, A. Rubenchik, M. H. Key, P. J. Wegner, A. K. Burnham, L. A. Hackel, and M. R. Kozlowski, “Methods for mitigating surface damage growth on NIF final optics,” Proc. SPIE 4679, 23–33 (2002).
[Crossref]

Marshall, C. D.

Matthews, M. J.

Mehta, N. C.

Menapace, J.

Menapace, J. A.

J. H. Campbell, R. A. Hawley-Fedder, C. J. Stolz, J. A. Menapace, M. R. Borden, P. K. Whitman, J. Yu, M. Runkel, M. O. Riley, M. D. Feit, and R. P. Hackel, “NIF optical materials and fabrication technologies: an overview,” Proc. SPIE 5341, 84–101 (2004).
[Crossref]

Milam, D.

M. A. Norton, L. W. Hrubesh, Z. Wu, E. E. Donohue, M. D. Feit, M. R. Kozlowski, D. Milam, K. P. Neeb, W. A. Moiander, A. M. Rubenchik, W. D. Sell, and P. Wegner, “Growth of laser initiated damage in fused silica at 351 nm,” Proc. SPIE 4347, 468 (2001).
[Crossref]

Miller, P.

Miller, P. E.

T. A. Laurence, J. D. Bude, N. Shen, T. Feldman, P. E. Miller, W. A. Steele, and T. Suratwala, “Metallic-like photoluminescence and absorption in fused silica surface flaws,” Appl. Phys. Lett. 94(15), 151114 (2009).
[Crossref]

Moiander, W. A.

M. A. Norton, L. W. Hrubesh, Z. Wu, E. E. Donohue, M. D. Feit, M. R. Kozlowski, D. Milam, K. P. Neeb, W. A. Moiander, A. M. Rubenchik, W. D. Sell, and P. Wegner, “Growth of laser initiated damage in fused silica at 351 nm,” Proc. SPIE 4347, 468 (2001).
[Crossref]

Molander, W. A.

L. W. Hrubesh, M. A. Norton, W. A. Molander, E. E. Donohue, S. M. Maricle, B. M. Penetrante, R. M. Brusasco, W. Grundler, J. A. Butler, J. W. Carr, R. M. Hill, L. J. Summers, M. D. Feit, A. Rubenchik, M. H. Key, P. J. Wegner, A. K. Burnham, L. A. Hackel, and M. R. Kozlowski, “Methods for mitigating surface damage growth on NIF final optics,” Proc. SPIE 4679, 23–33 (2002).
[Crossref]

Monticelli, M.

Moses, E.

Mouser, R.

M. R. Kozlowski, R. Mouser, S. Maricle, P. Wegner, and T. Weiland, “Laser Damage performance of fused silica optical components measured on the Beamlet Laser at 351 nm,” Proc. SPIE 26(9), 11744–11755 (2018).
[Crossref]

Murray, J. R.

Natoli, J. Y.

Natoli, J.-Y.

B. Bertussi, J.-Y. Natoli, M. Commandre, J. L. Rullier, F. Bonneau, P. Combis, and P. Bouchut, “Photothermal investigation of the laser-induced modification of a single gold nano-particle in a silica film,” Opt. Commun. 254(4-6), 299–309 (2005).
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Neauport, J.

Néauport, J.

Neeb, K. P.

M. A. Norton, L. W. Hrubesh, Z. Wu, E. E. Donohue, M. D. Feit, M. R. Kozlowski, D. Milam, K. P. Neeb, W. A. Moiander, A. M. Rubenchik, W. D. Sell, and P. Wegner, “Growth of laser initiated damage in fused silica at 351 nm,” Proc. SPIE 4347, 468 (2001).
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Negres, R. A.

R. A. Negres, D. A. Cross, Z. M. Liao, M. J. Matthews, and C. W. Carr, “Growth model for laser-induced damage on the exit surface of fused silica under UV, ns laser irradiation,” Opt. Express 22(4), 3824–3844 (2014).
[Crossref]

R. A. Negres, M. W. Burke, S. B. Sutton, P. DeMange, M. D. Feit, and S. G. Demos, “Evaluation of UV absorption coefficient in laser-modified fused silica,” Appl. Phys. Lett. 90(6), 061115 (2007).
[Crossref]

Norton, M. A.

G. J. Exarhos, M. A. Norton, A. H. Guenther, E. E. Donohue, M. D. Feit, K. L. Lewis, D. Ristau, R. P. Hackel, W. G. Hollingsworth, M. J. Soileau, C. J. Stolz, A. M. Rubenchik, and M. L. Spaeth, “Growth of laser damage on the input surface of SiO2 at 351 nm,” Proc. SPIE 6403, 64030H (2006).
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L. W. Hrubesh, M. A. Norton, W. A. Molander, E. E. Donohue, S. M. Maricle, B. M. Penetrante, R. M. Brusasco, W. Grundler, J. A. Butler, J. W. Carr, R. M. Hill, L. J. Summers, M. D. Feit, A. Rubenchik, M. H. Key, P. J. Wegner, A. K. Burnham, L. A. Hackel, and M. R. Kozlowski, “Methods for mitigating surface damage growth on NIF final optics,” Proc. SPIE 4679, 23–33 (2002).
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M. A. Norton, L. W. Hrubesh, Z. Wu, E. E. Donohue, M. D. Feit, M. R. Kozlowski, D. Milam, K. P. Neeb, W. A. Moiander, A. M. Rubenchik, W. D. Sell, and P. Wegner, “Growth of laser initiated damage in fused silica at 351 nm,” Proc. SPIE 4347, 468 (2001).
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Orth, C. D.

Parreault, R.

Patterson, R.

Penetrante, B. M.

L. W. Hrubesh, M. A. Norton, W. A. Molander, E. E. Donohue, S. M. Maricle, B. M. Penetrante, R. M. Brusasco, W. Grundler, J. A. Butler, J. W. Carr, R. M. Hill, L. J. Summers, M. D. Feit, A. Rubenchik, M. H. Key, P. J. Wegner, A. K. Burnham, L. A. Hackel, and M. R. Kozlowski, “Methods for mitigating surface damage growth on NIF final optics,” Proc. SPIE 4679, 23–33 (2002).
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H. S. Peng, X. M. Zhang, X. F. Wei, W. G. Zheng, F. Jing, Z. Sui, Q. Zhao, D. Y. Fan, Z. Q. Ling, and J. Q. Zhou, “Design of 60-kJ SG-III laser facility and related technology development,” Proc. SPIE 4424, 98–103 (2001).
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Ristau, D.

G. J. Exarhos, M. A. Norton, A. H. Guenther, E. E. Donohue, M. D. Feit, K. L. Lewis, D. Ristau, R. P. Hackel, W. G. Hollingsworth, M. J. Soileau, C. J. Stolz, A. M. Rubenchik, and M. L. Spaeth, “Growth of laser damage on the input surface of SiO2 at 351 nm,” Proc. SPIE 6403, 64030H (2006).
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Rondeau, O.

Rubenchik, A.

L. W. Hrubesh, M. A. Norton, W. A. Molander, E. E. Donohue, S. M. Maricle, B. M. Penetrante, R. M. Brusasco, W. Grundler, J. A. Butler, J. W. Carr, R. M. Hill, L. J. Summers, M. D. Feit, A. Rubenchik, M. H. Key, P. J. Wegner, A. K. Burnham, L. A. Hackel, and M. R. Kozlowski, “Methods for mitigating surface damage growth on NIF final optics,” Proc. SPIE 4679, 23–33 (2002).
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Rubenchik, A. M.

G. J. Exarhos, M. A. Norton, A. H. Guenther, E. E. Donohue, M. D. Feit, K. L. Lewis, D. Ristau, R. P. Hackel, W. G. Hollingsworth, M. J. Soileau, C. J. Stolz, A. M. Rubenchik, and M. L. Spaeth, “Growth of laser damage on the input surface of SiO2 at 351 nm,” Proc. SPIE 6403, 64030H (2006).
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A. M. Rubenchik and M. D. Feit, “Initiation, growth, and mitigation of UV-laser-induced damage in fused silica,” Proc. SPIE 4679, 79–95 (2002).
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M. A. Norton, L. W. Hrubesh, Z. Wu, E. E. Donohue, M. D. Feit, M. R. Kozlowski, D. Milam, K. P. Neeb, W. A. Moiander, A. M. Rubenchik, W. D. Sell, and P. Wegner, “Growth of laser initiated damage in fused silica at 351 nm,” Proc. SPIE 4347, 468 (2001).
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Rullier, J. L.

B. Bertussi, J.-Y. Natoli, M. Commandre, J. L. Rullier, F. Bonneau, P. Combis, and P. Bouchut, “Photothermal investigation of the laser-induced modification of a single gold nano-particle in a silica film,” Opt. Commun. 254(4-6), 299–309 (2005).
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Rullier, J.-L.

Runkel, M.

J. H. Campbell, R. A. Hawley-Fedder, C. J. Stolz, J. A. Menapace, M. R. Borden, P. K. Whitman, J. Yu, M. Runkel, M. O. Riley, M. D. Feit, and R. P. Hackel, “NIF optical materials and fabrication technologies: an overview,” Proc. SPIE 5341, 84–101 (2004).
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Sacks, R. A.

Sajeesh, T. H.

A. R. Warrier, T. H. Sajeesh, C. S. Kartha, and K. P. Vijayakumar, “Determination of thermal and electronic carrier transport properties of SnS thinfilms using photothermal beam deflection technique,” Mater. Res. Bull. 47(11), 3758–3763 (2012).
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Sanner, N.

B. Bussiere, N. Sanner, M. Sentis, and O. Uteza, “Importance of surface topography on pulsed laser-induced damage threshold of Sapphire crystals,” Sci. Rep. 7(1), 1249 (2017).
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Sell, W. D.

M. A. Norton, L. W. Hrubesh, Z. Wu, E. E. Donohue, M. D. Feit, M. R. Kozlowski, D. Milam, K. P. Neeb, W. A. Moiander, A. M. Rubenchik, W. D. Sell, and P. Wegner, “Growth of laser initiated damage in fused silica at 351 nm,” Proc. SPIE 4347, 468 (2001).
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B. Bussiere, N. Sanner, M. Sentis, and O. Uteza, “Importance of surface topography on pulsed laser-induced damage threshold of Sapphire crystals,” Sci. Rep. 7(1), 1249 (2017).
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Spaeth, M. L.

G. J. Exarhos, M. A. Norton, A. H. Guenther, E. E. Donohue, M. D. Feit, K. L. Lewis, D. Ristau, R. P. Hackel, W. G. Hollingsworth, M. J. Soileau, C. J. Stolz, A. M. Rubenchik, and M. L. Spaeth, “Growth of laser damage on the input surface of SiO2 at 351 nm,” Proc. SPIE 6403, 64030H (2006).
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Steele, W. A.

T. A. Laurence, J. D. Bude, N. Shen, T. Feldman, P. E. Miller, W. A. Steele, and T. Suratwala, “Metallic-like photoluminescence and absorption in fused silica surface flaws,” Appl. Phys. Lett. 94(15), 151114 (2009).
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Z. L. Wu, M. Thomsen, P. K. Kuo, Y. S. Lu, C. Stolz, and M. Kozlowski, “Photothermal characterization of optical thin film coatings,” Opt. Eng. 36(1), 251–262 (1997).
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Stolz, C. J.

G. J. Exarhos, M. A. Norton, A. H. Guenther, E. E. Donohue, M. D. Feit, K. L. Lewis, D. Ristau, R. P. Hackel, W. G. Hollingsworth, M. J. Soileau, C. J. Stolz, A. M. Rubenchik, and M. L. Spaeth, “Growth of laser damage on the input surface of SiO2 at 351 nm,” Proc. SPIE 6403, 64030H (2006).
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J. H. Campbell, R. A. Hawley-Fedder, C. J. Stolz, J. A. Menapace, M. R. Borden, P. K. Whitman, J. Yu, M. Runkel, M. O. Riley, M. D. Feit, and R. P. Hackel, “NIF optical materials and fabrication technologies: an overview,” Proc. SPIE 5341, 84–101 (2004).
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H. J. Liu, X. Ye, X. D. Zhou, J. Huang, F. R. Wang, X. Y. Zhou, W. D. Wu, X. D. Jiang, Z. Sui, and W. G. Zheng, “Subsurface defects characterization and laser damage performance of fused silica optics during HF-etched process,” Opt. Mater. 36(5), 855–860 (2014).
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H. S. Peng, X. M. Zhang, X. F. Wei, W. G. Zheng, F. Jing, Z. Sui, Q. Zhao, D. Y. Fan, Z. Q. Ling, and J. Q. Zhou, “Design of 60-kJ SG-III laser facility and related technology development,” Proc. SPIE 4424, 98–103 (2001).
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L. W. Hrubesh, M. A. Norton, W. A. Molander, E. E. Donohue, S. M. Maricle, B. M. Penetrante, R. M. Brusasco, W. Grundler, J. A. Butler, J. W. Carr, R. M. Hill, L. J. Summers, M. D. Feit, A. Rubenchik, M. H. Key, P. J. Wegner, A. K. Burnham, L. A. Hackel, and M. R. Kozlowski, “Methods for mitigating surface damage growth on NIF final optics,” Proc. SPIE 4679, 23–33 (2002).
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J. Bude, P. Miller, S. Baxamusa, N. Shen, T. Laurence, W. Steele, T. Suratwala, L. Wong, W. Carr, D. Cross, and M. Monticelli, “High fluence laser damage precursors and their mitigation in fused silica,” Opt. Express 22(5), 5839–5851 (2014).
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T. A. Laurence, J. D. Bude, N. Shen, T. Feldman, P. E. Miller, W. A. Steele, and T. Suratwala, “Metallic-like photoluminescence and absorption in fused silica surface flaws,” Appl. Phys. Lett. 94(15), 151114 (2009).
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Sutton, S. B.

Thomsen, M.

Z. L. Wu, M. Thomsen, P. K. Kuo, Y. S. Lu, C. Stolz, and M. Kozlowski, “Photothermal characterization of optical thin film coatings,” Opt. Eng. 36(1), 251–262 (1997).
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B. Bussiere, N. Sanner, M. Sentis, and O. Uteza, “Importance of surface topography on pulsed laser-induced damage threshold of Sapphire crystals,” Sci. Rep. 7(1), 1249 (2017).
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Vijayakumar, K. P.

A. R. Warrier, T. H. Sajeesh, C. S. Kartha, and K. P. Vijayakumar, “Determination of thermal and electronic carrier transport properties of SnS thinfilms using photothermal beam deflection technique,” Mater. Res. Bull. 47(11), 3758–3763 (2012).
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H. J. Liu, X. Ye, X. D. Zhou, J. Huang, F. R. Wang, X. Y. Zhou, W. D. Wu, X. D. Jiang, Z. Sui, and W. G. Zheng, “Subsurface defects characterization and laser damage performance of fused silica optics during HF-etched process,” Opt. Mater. 36(5), 855–860 (2014).
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G. Y. Xiao, D. Y. Fan, S. J. Wang, Z. Q. Lin, Y. Gu, J. Q. Zhu, Y. X. Zhen, J. Zhu, F. Q. Liu, S. H. Chen, Q. H. Chen, G. L. Huang, and X. M. Deng, “SG-II solid state laser ICF system,” Proc. SPIE 3492, 890–895 (1999).
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A. R. Warrier, T. H. Sajeesh, C. S. Kartha, and K. P. Vijayakumar, “Determination of thermal and electronic carrier transport properties of SnS thinfilms using photothermal beam deflection technique,” Mater. Res. Bull. 47(11), 3758–3763 (2012).
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Wegner, P.

M. R. Kozlowski, R. Mouser, S. Maricle, P. Wegner, and T. Weiland, “Laser Damage performance of fused silica optical components measured on the Beamlet Laser at 351 nm,” Proc. SPIE 26(9), 11744–11755 (2018).
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H. S. Peng, X. M. Zhang, X. F. Wei, W. G. Zheng, F. Jing, Z. Sui, Q. Zhao, D. Y. Fan, Z. Q. Ling, and J. Q. Zhou, “Design of 60-kJ SG-III laser facility and related technology development,” Proc. SPIE 4424, 98–103 (2001).
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Weiland, T.

M. R. Kozlowski, R. Mouser, S. Maricle, P. Wegner, and T. Weiland, “Laser Damage performance of fused silica optical components measured on the Beamlet Laser at 351 nm,” Proc. SPIE 26(9), 11744–11755 (2018).
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Welsch, E.

White, R. K.

Whitman, P. K.

J. H. Campbell, R. A. Hawley-Fedder, C. J. Stolz, J. A. Menapace, M. R. Borden, P. K. Whitman, J. Yu, M. Runkel, M. O. Riley, M. D. Feit, and R. P. Hackel, “NIF optical materials and fabrication technologies: an overview,” Proc. SPIE 5341, 84–101 (2004).
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Williams, W. H.

Wilson, T. S.

Wong, L.

Wonterghem, B. M. V.

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H. J. Liu, X. Ye, X. D. Zhou, J. Huang, F. R. Wang, X. Y. Zhou, W. D. Wu, X. D. Jiang, Z. Sui, and W. G. Zheng, “Subsurface defects characterization and laser damage performance of fused silica optics during HF-etched process,” Opt. Mater. 36(5), 855–860 (2014).
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Wu, Z.

M. A. Norton, L. W. Hrubesh, Z. Wu, E. E. Donohue, M. D. Feit, M. R. Kozlowski, D. Milam, K. P. Neeb, W. A. Moiander, A. M. Rubenchik, W. D. Sell, and P. Wegner, “Growth of laser initiated damage in fused silica at 351 nm,” Proc. SPIE 4347, 468 (2001).
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J. Chen, J. T. Dong, and Z. L. Wu, “In-situ investigation of damage processes on fused silica induced by a pulsed 355 nm laser with high repetition rate,” Proc. SPIE 9345, 93450A (2015).
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J. Chen, J. T. Dong, and Z. L. Wu, “Development of a “turn-key” system for weak absorption measurement and analysis,” Proc. SPIE 8786, 87861M (2013).
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G. Y. Xiao, D. Y. Fan, S. J. Wang, Z. Q. Lin, Y. Gu, J. Q. Zhu, Y. X. Zhen, J. Zhu, F. Q. Liu, S. H. Chen, Q. H. Chen, G. L. Huang, and X. M. Deng, “SG-II solid state laser ICF system,” Proc. SPIE 3492, 890–895 (1999).
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Yan, C. Y.

Yang, S. T.

Ye, X.

H. J. Liu, X. Ye, X. D. Zhou, J. Huang, F. R. Wang, X. Y. Zhou, W. D. Wu, X. D. Jiang, Z. Sui, and W. G. Zheng, “Subsurface defects characterization and laser damage performance of fused silica optics during HF-etched process,” Opt. Mater. 36(5), 855–860 (2014).
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Yu, J.

J. H. Campbell, R. A. Hawley-Fedder, C. J. Stolz, J. A. Menapace, M. R. Borden, P. K. Whitman, J. Yu, M. Runkel, M. O. Riley, M. D. Feit, and R. P. Hackel, “NIF optical materials and fabrication technologies: an overview,” Proc. SPIE 5341, 84–101 (2004).
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Zhang, X. M.

H. S. Peng, X. M. Zhang, X. F. Wei, W. G. Zheng, F. Jing, Z. Sui, Q. Zhao, D. Y. Fan, Z. Q. Ling, and J. Q. Zhou, “Design of 60-kJ SG-III laser facility and related technology development,” Proc. SPIE 4424, 98–103 (2001).
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Zhao, Q.

H. S. Peng, X. M. Zhang, X. F. Wei, W. G. Zheng, F. Jing, Z. Sui, Q. Zhao, D. Y. Fan, Z. Q. Ling, and J. Q. Zhou, “Design of 60-kJ SG-III laser facility and related technology development,” Proc. SPIE 4424, 98–103 (2001).
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Zhen, Y. X.

G. Y. Xiao, D. Y. Fan, S. J. Wang, Z. Q. Lin, Y. Gu, J. Q. Zhu, Y. X. Zhen, J. Zhu, F. Q. Liu, S. H. Chen, Q. H. Chen, G. L. Huang, and X. M. Deng, “SG-II solid state laser ICF system,” Proc. SPIE 3492, 890–895 (1999).
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Zheng, W. G.

H. J. Liu, X. Ye, X. D. Zhou, J. Huang, F. R. Wang, X. Y. Zhou, W. D. Wu, X. D. Jiang, Z. Sui, and W. G. Zheng, “Subsurface defects characterization and laser damage performance of fused silica optics during HF-etched process,” Opt. Mater. 36(5), 855–860 (2014).
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H. S. Peng, X. M. Zhang, X. F. Wei, W. G. Zheng, F. Jing, Z. Sui, Q. Zhao, D. Y. Fan, Z. Q. Ling, and J. Q. Zhou, “Design of 60-kJ SG-III laser facility and related technology development,” Proc. SPIE 4424, 98–103 (2001).
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Zhou, J. Q.

H. S. Peng, X. M. Zhang, X. F. Wei, W. G. Zheng, F. Jing, Z. Sui, Q. Zhao, D. Y. Fan, Z. Q. Ling, and J. Q. Zhou, “Design of 60-kJ SG-III laser facility and related technology development,” Proc. SPIE 4424, 98–103 (2001).
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Zhou, X. D.

H. J. Liu, X. Ye, X. D. Zhou, J. Huang, F. R. Wang, X. Y. Zhou, W. D. Wu, X. D. Jiang, Z. Sui, and W. G. Zheng, “Subsurface defects characterization and laser damage performance of fused silica optics during HF-etched process,” Opt. Mater. 36(5), 855–860 (2014).
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Zhou, X. Y.

H. J. Liu, X. Ye, X. D. Zhou, J. Huang, F. R. Wang, X. Y. Zhou, W. D. Wu, X. D. Jiang, Z. Sui, and W. G. Zheng, “Subsurface defects characterization and laser damage performance of fused silica optics during HF-etched process,” Opt. Mater. 36(5), 855–860 (2014).
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G. Y. Xiao, D. Y. Fan, S. J. Wang, Z. Q. Lin, Y. Gu, J. Q. Zhu, Y. X. Zhen, J. Zhu, F. Q. Liu, S. H. Chen, Q. H. Chen, G. L. Huang, and X. M. Deng, “SG-II solid state laser ICF system,” Proc. SPIE 3492, 890–895 (1999).
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G. Y. Xiao, D. Y. Fan, S. J. Wang, Z. Q. Lin, Y. Gu, J. Q. Zhu, Y. X. Zhen, J. Zhu, F. Q. Liu, S. H. Chen, Q. H. Chen, G. L. Huang, and X. M. Deng, “SG-II solid state laser ICF system,” Proc. SPIE 3492, 890–895 (1999).
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Appl. Opt. (3)

Appl. Phys. Lett. (2)

R. A. Negres, M. W. Burke, S. B. Sutton, P. DeMange, M. D. Feit, and S. G. Demos, “Evaluation of UV absorption coefficient in laser-modified fused silica,” Appl. Phys. Lett. 90(6), 061115 (2007).
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T. A. Laurence, J. D. Bude, N. Shen, T. Feldman, P. E. Miller, W. A. Steele, and T. Suratwala, “Metallic-like photoluminescence and absorption in fused silica surface flaws,” Appl. Phys. Lett. 94(15), 151114 (2009).
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M. L. Andre, “The French Megajoule Laser Project (LMJ),” Fusion Eng. Des. 44(1-4), 43–49 (1999).
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J. Opt. Soc. Am. A (1)

Mater. Res. Bull. (1)

A. R. Warrier, T. H. Sajeesh, C. S. Kartha, and K. P. Vijayakumar, “Determination of thermal and electronic carrier transport properties of SnS thinfilms using photothermal beam deflection technique,” Mater. Res. Bull. 47(11), 3758–3763 (2012).
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Opt. Commun. (1)

B. Bertussi, J.-Y. Natoli, M. Commandre, J. L. Rullier, F. Bonneau, P. Combis, and P. Bouchut, “Photothermal investigation of the laser-induced modification of a single gold nano-particle in a silica film,” Opt. Commun. 254(4-6), 299–309 (2005).
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Opt. Eng. (1)

Z. L. Wu, M. Thomsen, P. K. Kuo, Y. S. Lu, C. Stolz, and M. Kozlowski, “Photothermal characterization of optical thin film coatings,” Opt. Eng. 36(1), 251–262 (1997).
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T. A. Laurence, J. D. Bude, S. Ly, N. Shen, and M. D. Feit, “Extracting the distribution of laser damage precursors on fused silica surfaces for 351 nm, 3 ns laser pulses at high fluences (20-150 J/cm2),” Opt. Express 20(10), 11561–11573 (2012).
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W. Small IV, T. S. Wilson, W. J. Benett, J. M. Loge, and D. J. Maitland, “Laser-activated shape memory polymer intravascular thrombectomy device,” Opt. Express 13(20), 8204–8213 (2005).
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Figures (10)

Fig. 1.
Fig. 1. Sketch of the photothermal spectroscopy measurement for fused silica irradiated by a UV laser.
Fig. 2.
Fig. 2. Dependence of the size of damage sites on the damage laser parameters by optical microscope: a) laser fluence (1 Hz & 1shot), b) number of shots (1 Hz & 4.5J/cm2), c) PRFs (50shots & 4.5J/cm2). The size of each damage point was measured four times to get the average value. The uncertainty of the results is less than 0.01.
Fig. 3.
Fig. 3. Influence of the damage laser fluence on photothermal signals (@1 Hz and 1 shot): a) 3.9 J/cm2, b) 4.1 J/cm2, c) 4.5J/cm2, d) 6.8J/cm2, e) 9.1 J/cm2, f) 13.6 J/cm2, g) 22.7 J/cm2, h) 45.4 J/cm2.
Fig. 4.
Fig. 4. Influence of the number of shots on photothermal signals (@1 Hz and 4.5J/cm2): a) 1 shot, b) 10 shots, c) 20 shots, d) 40 shots, e) 50 shots, f) 100 shots
Fig. 5.
Fig. 5. Influence of the PRFs on photothermal signals (@50 shots and 4.5 J/cm2): a) 1 Hz, b) 2 Hz, c) 5 Hz, d) 10 Hz
Fig. 6.
Fig. 6. Stability of the photothermal absorption signal dependence on 2.5 W 355 nm laser in different damage sites: a) undamaged, b) contaminant existed, c) pre-damaged, d) damaged
Fig. 7.
Fig. 7. Photothermal absorption signal intensity dependence on the laser parameters: a) laser fluence, b) number of pulses, c) PRFs. The intensity of the photothermal absorption signal is the peak value of the experimental data obtained by the photothermal testing instrument.
Fig. 8.
Fig. 8. Comparison of the morphology of the damage pits irradiated by a 355 nm 6.8 ns UV laser with a given laser intensity of 4.2 J/cm2 measured by OM and PT: a) OM-1 shot, b) PT-1 shot, c) OM-50 shots, d) PT-50 shots.
Fig. 9.
Fig. 9. Comparison of the area of the damage pits measured by OM and PT: a) laser fluence (1 shot-1 Hz), b) the number of shots (4.2 J /cm2-1 Hz), c) PRF (4.2 J /cm2-50 shots), d) PRF (18 J/cm2-10 shots). The areas of each damage point were measured four times to get the average value. The uncertainty of the results is less than 0.03.
Fig. 10.
Fig. 10. The LDAVR varies with laser parameters: a) laser fluence, b) the number of shots, c) PRF. The ratio is obtained by the ratio of the average area measured by two different methods.

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